TOYOTech, Sharp Display Technology Corporation (Mie, Japan), and the Japan Advanced Institute of Science and Technology (Ishikawa, Japan) have developed a novel measurement technology to analyze the behavior of Organic Light Emitting Diodes (OLEDs) under extremely low luminance conditions.
This new technology measures the gap between the onset voltage of current change and the emission voltage—factors closely linked to OLED degradation. It is expected to play a critical role in analyzing display Mura, a defect that appears in low luminance or as OLEDs degrade.
OLEDs emit light when a voltage is applied to organic compounds, enabling the creation of displays that are thinner, lighter, and more energy-efficient, suitable for devices like TVs and smartphones. Unlike Liquid Crystal Displays (LCDs), OLEDs have a simpler structure due to their self-emissive properties, which eliminate the need for a backlight. OLEDs are formed by stacking multiple layers of thin films, and their performance depends on optimizing deposition conditions. Traditionally, these characteristics have been evaluated using J-V-L (current density-voltage-luminance) measurements, which track current and luminance as voltage is applied. However, J-V-L technology has limitations in detecting small currents and low luminance levels at the start of OLED light emission.
The newly developed technology overcomes these challenges by measuring both the small displacement current flowing through the OLED and the emission intensity using a highly sensitive silicon photodiode. This allows for precise detection of the difference between the onset voltage of current change and the start of light emission. The system can also measure both current and luminance across a wide range of luminance levels, from extremely low to high, enabling comprehensive analysis of display Mura and contributing to the further enhancement of OLED display performance.
This measurement technology was presented at the International Meeting on Information Display Conference 2024 (IMID2024) in Korea, held from August 20-23. TOYOTech will officially launch the DCM1000 DC-JVL Measurement System for global customers on October 1st, 2024. For more information, visit https://toyotechus.com/lab-dcm1000/ or contact us at info@toyotechus.com.
About TOYOTech
TOYOTech is a wholly owned local subsidiary of TOYO Corporation. The company provides the customers in the US and other countries with TOYO Corporation’s self-developed products incorporating the know-how and technologies accumulated over many decades, as well as TOYOTech’s own-developed products that are unique in the markets – these include test and measurement solutions for automobile, new materials, ICT, and EMC applications among others. At the same time, TOYOTech keeps a keen eye on the newly emerging technologies and up-to-date information in Silicon Valley, a holy site of innovation, actively collaborating with startups and seeking M&A opportunities. For more information, please visit the company’s website at www.toyotechus.com.
All trademarks used in this document are the property of their respective owners. TOYO reserves the right to change product content and product specifications without prior notice. Contact your sales consultant for the latest information.
This was a sponsored post by TOYOTech