Bruker announced a new photoconductive atomic-force Microscopy (pcAFM) module for the Dimension Icon platform. The new modules enables sample illumination while performing nanoscale electrical characterization. Bruker says that the new module (combined with their PeakForce TUNA technology) enables the highest resolution photoconductivity and nanomechanical mapping for OLED (or OPV) device samples.
The new modules provides uniform backside illumination and can be fiber coupled to industry-standard solar simulators for OPV testing. It is compatible with Bruker’s turnkey 1ppm glove box configuration.
Posted: Aug 15,2012 by Ron Mertens
