Fluxim launched a new all-in-one measurement system called paios for the characterization of organic devices (OLEDs and OPVs). Paios is used for extracting material and device parameters such as the charge carrier mobility by performing a range of dynamic electrical measurement techniques including CELIV, impedance spectroscopy and transient space-charge-limited currents.
Paios complements the company's setfos device simulation software. Fluxim says that by using paios and comparing measurement and simulation results, crucial parameters may be extracted and physical models can be validated - and this leads to more predictive simulation results.
Posted: Jan 21,2013 by Ron Mertens
